• DocumentCode
    481946
  • Title

    Analytical modeling of semiconductor losses in three level inverter for FACTS applications

  • Author

    Mancilla-David, Fernando ; Venkataramanan, Giri

  • Author_Institution
    Univ. of Colorado Denver, Denver, CO
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    3219
  • Lastpage
    3226
  • Abstract
    Power circuits used in prototype applications for flexible AC transmission systems (FACTS) have consisted of multiple three level or neutral point clamped power converters interfaced to the power system using transformer arrangements for improving waveform quality. This paper presents analytical modeling to determine semiconductor losses in such multi-pulse voltage source DC-AC converters used for FACTS applications. Device current and voltage waveforms during all operating conditions are used to develop behavioral loss models to determine power losses in each of the power semiconductors constituting an inverter pole. The results are used to determine the total power losses in an SSSC application. Computer simulation waveforms are used to demonstrate overall system performance.
  • Keywords
    DC-AC power convertors; flexible AC transmission systems; invertors; power semiconductor devices; power transformers; FACTS applications; behavioral loss models; computer simulation; computer simulation waveforms; flexible AC transmission systems; multiple three level converters; multipulse voltage source DC-AC converters; neutral point clamped power converters; power circuits; semiconductor losses; three level inverter; transformer arrangements; waveform quality; Analytical models; Application software; Computer simulation; Flexible AC transmission systems; Flexible printed circuits; Inverters; Power system analysis computing; Power system modeling; Prototypes; System performance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758476
  • Filename
    4758476