DocumentCode :
483344
Title :
Characterization of off Chip ESD protection devices
Author :
Ashton, Robert ; Lescouzeres, Lionel
Author_Institution :
ON Semicond., Phoenix, AZ
fYear :
2008
fDate :
7-11 Sept. 2008
Firstpage :
21
Lastpage :
29
Abstract :
ESD protection devices are placed on circuit boards to protect integrated circuits from ESD stress to systems. There are no generally accepted standards for characterizing the ESD performance of such devices. This article will make recommendations for the proper procedures for characterizing off chip ESD protection devices.
Keywords :
electrostatic discharge; printed circuits; protection; ESD stress; circuit boards; integrated circuits; off chip ESD protection devices; Circuit testing; Current measurement; Electrostatic discharge; IEC standards; Power system protection; Printed circuits; Pulse measurements; Robustness; Stress; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2008. EOS/ESD 2008. 30th
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-58537-146-4
Electronic_ISBN :
978-1-58537-147-1
Type :
conf
Filename :
4772111
Link To Document :
بازگشت