Title :
Single pulse CDM testing and its relevance to IC reliability
Author :
Jahanzeb, Agha ; Duvvury, Charvaka ; Schichl, Joe ; McGee, James ; Marum, Steve ; Koeppen, Peter ; Ward, Scott ; Lin, Yen-Yi
Author_Institution :
Texas Instrum., Dallas, TX, USA
Abstract :
Comparison between single pulse and standard three pulse testing is presented for Charged Device Model (CDM). It is proposed that single pulse per pin testing should be sufficient for reliability. This method avoids issues due to the cumulative nature of multiple pulses and is a closer representation of real world.
Keywords :
integrated circuit reliability; integrated circuit testing; CDM; IC reliability; charged device model; single pulse testing; three pulse testing; Biological system modeling; Degradation; Humans; Instruments; Integrated circuit modeling; Integrated circuit testing; Packaging; Sockets; Stress; Voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2008. EOS/ESD 2008. 30th
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-58537-146-4
Electronic_ISBN :
978-1-58537-147-1
