DocumentCode :
483698
Title :
Characterization of small cracks in eddy current testing
Author :
Le Bihan, Yann ; Pavo, Jozsef ; Marchand, Claude
Author_Institution :
Laboratoire de G??nie Electrique de Paris (LGEP); CNRS UMR8507; Supelec; Univ Pierre et Marie Curie-P6; Univ Paris Sud-P11, 91192 Gif-sur-Yvette, France
fYear :
2007
fDate :
24-25 May 2007
Firstpage :
1
Lastpage :
7
Abstract :
A study on the characterization of small cracks by using eddy current testing (ECT) signal is presented. The significant parameters of the ECT data are selected using principal component analysis according to two approaches. The ECT signal inversion is then achieved using a parametric model trained with synthetic data obtained with a fast numerical simulation tool. The characterization procedure is then tested using experimental data. Results show that information can be obtained concerning the area of the cracks.
fLanguage :
English
Publisher :
iet
Conference_Titel :
Reliability in Electromagnetic Systems, 2007 IET Colloquium on
Conference_Location :
Paris, France
ISSN :
0537-9989
Print_ISBN :
978-0-86341-809-9
Type :
conf
Filename :
4775328
Link To Document :
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