DocumentCode :
484101
Title :
Estimating Wheat Equivalent Water Thickness Using Landsat TM/ETM+ Data
Author :
Ghulam, Abduwasit ; Kusky, Tim ; Qiming Qin ; Li, Zhao-Liang ; Kasimu, A.
Author_Institution :
Center for Environ. Sci., St. Louis Univ., St. Louis, MO
Volume :
2
fYear :
2008
fDate :
7-11 July 2008
Abstract :
Atmospheric corrected Landsat Enhanced Thematic Mapper Plus (ETM+) near-infrared (NIR) and shortwave infrared (SWIR) band reflectances are used to develop a new index to monitor vegetation water content (VWC) in terms of equivalent water thickness (EWT, cm). This paper outlines the first part of a research program to investigate the potential and physical basis of wavelengths in the optical domain to assess the VWC. Then, a method called vegetation water content index (VWCI) were developed using SWIR, and NIR wavelengths of ETM+ data. The relationship between the EWT at canopy level is explored through linking leaf reflectance data obtained from PROSPECT with canopy reflectance from SailH and in-situ measurements. Significant correlations are found between canopy EWT and the developed index for both modeled and ground measured data.
Keywords :
atmospheric boundary layer; crops; evaporation; geophysical techniques; moisture; radiative transfer; remote sensing; soil; transpiration; Beijing; China; EWT; Landsat Enhanced Thematic Mapper Plus; Landsat TM-ETM+ data; NDVI; NIR wavelength; PROSPECT; SWIR wavelength; SailH; canopy water content; chlorophyll; equivalent water thickness; evapotranspiration; in-situ measurement; leaf reflectance data; near-infrared; normalized difference vegetation index; radiative transfer model; shortwave infrared; soil moisture; vegetation water content index; wheat water thickness estimation; Geographic Information Systems; Moisture; Reflectivity; Remote sensing; Satellites; Shape; Soil; Vegetation mapping; Water resources; Wavelength measurement; Leaf water content; vegetation water content estimation; vegetation water content index (VWCI);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
Type :
conf
DOI :
10.1109/IGARSS.2008.4779111
Filename :
4779111
Link To Document :
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