• DocumentCode
    484125
  • Title

    Kernel-Based Nonlinear Feature Extraction for Image Classification

  • Author

    Chou, Po-Wen ; Hsieh, Pi-Fuei ; Hsieh, Chia-Cheng

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Nat. Cheng Kung Univ., Tainan
  • Volume
    2
  • fYear
    2008
  • fDate
    7-11 July 2008
  • Abstract
    Recently, nonlinear feature extraction algorithms based on a so-called kernel trick have appeared to reduce the limitations of linear feature extraction methods with respect to class discrimination. This study presents a new kernel function that integrates the discriminative information from class labels and spatial contexts into the basic radial basis function (RBF). We represent the mutual closeness of samples in terms of the average class membership probability and explore contextual information by means of Markov random field models. By fusing additional discriminative information into the kernel feature space, the proposed kernel function outperforms the basic RBF kernel function. A more compact set of features have shown equivalent effectiveness. Experiments also demonstrate that using spatial contextual information during feature extraction can be more efficient than using the information during the classification stage.
  • Keywords
    Markov processes; feature extraction; geophysical techniques; image classification; radial basis function networks; Markov random field models; RBF kernel function; image classification; kernel feature space; linear feature extraction methods; nonlinear feature extraction algorithms; radial basis function; Algorithm design and analysis; Computer science; Context modeling; Feature extraction; Image classification; Information resources; Kernel; Linear discriminant analysis; Markov random fields; Principal component analysis; classification; dimensionality reduction; feature extraction; kernel trick;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-2807-6
  • Electronic_ISBN
    978-1-4244-2808-3
  • Type

    conf

  • DOI
    10.1109/IGARSS.2008.4779148
  • Filename
    4779148