Title :
A Progressive Refinement Approach to Aerial Image Registration Using Local Transform Perturbations
Author :
DelMarco, Stephen ; Webb, Helen ; Tom, Victor ; Jenkins, Todd
Author_Institution :
BAE Syst., Burlington, MA
Abstract :
Spatial domain log-polar approaches have demonstrated success for video image registration. However, the log-polar representation is sensitive to origin location. This drawback often necessitates performing a parameter sweep over log-polar origin location, which can be time-consuming. In this paper we present an alternative approach that is appropriate for small to moderate scale, rotational, and skew misalignments but allows large translational offset. We use a form of robust phase correlation to estimate the gross translation, then perform a local search over log-polar origin to fine tune the translation. We sequentially estimate affine transform parameters by maximizing a measure of registration solution verity. We also investigate the effect of scale and rotational initial alignment errors on the robustness of the initial phase correlation to estimate gross translation. We present results using video imagery acquired from a real aerial video surveillance system.
Keywords :
affine transforms; geophysical signal processing; geophysical techniques; image registration; remote sensing; video signal processing; aerial image registration; aerial video surveillance system; affine transform parameters; gross translation estimation; initial phase correlation; local transform perturbations; log-polar origin location; progressive refinement; registration solution verity measure; robust phase correlation; rotational initial alignment error effects; scale effects; spatial domain log-polar techniques; video image registration; Fourier transforms; Hyperspectral imaging; Image registration; Layout; Noise robustness; Parameter estimation; Phase estimation; System testing; Video surveillance; Virtual manufacturing; phase correlation; registration; video;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
DOI :
10.1109/IGARSS.2008.4779191