DocumentCode :
484275
Title :
Analysis of Polarimetric Surface Scattering in High Resolution SAR
Author :
PARK, Sang-Eun ; Ferro-Famil, Laurent ; Allain, Sophie ; Pottier, Eric
Author_Institution :
IETR, Univ. of Rennes 1, Rennes
Volume :
3
fYear :
2008
fDate :
7-11 July 2008
Abstract :
Statistical properties of rough surfaces can be affected by the spatial resolution of the radar sensor. This study aims to understand effects of the spatial resolution on the statistical description of surface roughness properties and on the surface scattering characteristics of polarimetric radar signal. A new expression for the surface autocovariance function and its corresponding roughness spectrum is proposed in order to characterize surface scattering. Results represent increases in the backscattering coefficients in accordance with decreases in the resolution cell size. Conventional continuous spectrum in the theoretical scattering model could underestimate the radar response in case of the surface defined by high correlation length.
Keywords :
backscatter; geophysical techniques; radar polarimetry; remote sensing by radar; surface scattering; backscattering; conventional continuous spectrum; polarimetric radar signal; radar sensor; rough surfaces; roughness spectrum; spatial resolution; statistical property; surface autocovariance function; surface roughness property; surface scattering characteristics; theoretical scattering model; Backscatter; Radar antennas; Radar polarimetry; Radar scattering; Rough surfaces; Sensor phenomena and characterization; Spatial resolution; Surface fitting; Surface roughness; Synthetic aperture radar; Radar polarimetry; microwave surface scattering; surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
Type :
conf
DOI :
10.1109/IGARSS.2008.4779366
Filename :
4779366
Link To Document :
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