Title :
RHBD Technique for Single-Event Charge Cancellation in Folded-Cascode Amplifiers
Author :
Atkinson, N.M. ; Blaine, R.W. ; Kauppila, J.S. ; Armstrong, S.E. ; Loveless, T.D. ; Hooten, N.C. ; Holman, W.T. ; Massengill, Lloyd W. ; Warner, Jeffrey H.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
Abstract :
A novel RHBD technique that exploits charge sharing is implemented in the single-ended gain stage of a folded-cascode operational amplifier to mitigate single-event transients (SETs). The efficacy of the technique is demonstrated via two-photon laser experiments. Using settling time as the primary metric for SET severity, the proposed layout technique achieves sensitive area reductions ranging from 41% to 95% with an overall area penalty of less than 1%.
Keywords :
operational amplifiers; radiation hardening (electronics); transients; RHBD technique; SET severity; charge sharing; folded-cascode operational amplifier; radiation-hardened-by-design technique; sensitive area reductions; settling time; single-ended gain stage; single-event transients; two-photon laser experiments; Lasers; Layout; Measurement; Operational amplifiers; Radiation effects; Transient analysis; Transistors; Charge sharing; differential charge cancellation (DCC); operational amplifier; sensitive node active charge cancellation (SNACC); single-event effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2240316
