Sensitivity Analysis of the Simulated Annealing Method to Measurement Noise for the Inversion of Subsurface Parameters of Two Layer Rough Surfaces

Author

Tabatabaeenejad, Alireza ; Moghaddam, Mahta

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI

Volume

3

fYear

2008

fDate

7-11 July 2008

Abstract

We have shown that the method of simulated annealing (SA) is capable of inverting subsurface parameters of a three-dimensional, two-layer dielectric structure with slightly rough interfaces. In this work, we address the sensitivity of the Simulated Annealing to measurement noise. We also study the impact of the number of measurement parameters, i.e., number of frequency points and number of observation angles, on sensitivity of the inversion algorithm.

Keywords

Gaussian noise; dielectric properties; geophysical techniques; inverse problems; measurement uncertainty; rough surfaces; sensitivity analysis; simulated annealing; Gaussian noise; dielectric structure; measurement noise; sensitivity analysis; simulated annealing method; subsurface parameter inversion; two layer rough surfaces; Analytical models; Computational modeling; Frequency measurement; Noise measurement; Pollution measurement; Rough surfaces; Sensitivity analysis; Simulated annealing; Surface roughness; Surface structures; Layered rough surfaces; Simulated Annealing; inversion; measurement parameters; noise; sensitivity; subsurface parameters;

fLanguage

English

Publisher

ieee

Conference_Titel

Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International

Conference_Location

Boston, MA

Print_ISBN

978-1-4244-2807-6

Electronic_ISBN

978-1-4244-2808-3

Type

conf

DOI

10.1109/IGARSS.2008.4779555

Filename

4779555