• DocumentCode
    48457
  • Title

    Characteristics of Arcs Between Porous Carbon Electrodes

  • Author

    Carvou, E. ; Le Garrec, Jean Luc ; Mitchell, J.B.A.

  • Author_Institution
    Inst. de Phys. de Rennes, Univ. de Rennes 1, Rennes, France
  • Volume
    41
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    3151
  • Lastpage
    3158
  • Abstract
    Arcs between carbon electrodes present some specific differences compared with metallic arcs. The arc voltage is higher, but does not attain a stable value displaying large fluctuations. Indeed, the arcs are produced by the direct sublimation of the electrodes, without passing through a molten phase. The arc production is also facilitated by both circuit breaking and electric field breakdown. In this paper, arcing has been examined under various conditions (voltage, current, and opening or fixed interelectrode gap) and particular attention has been given to the ability of the system to sustain the arc due to reignition. Small-angle X-ray scattering has been used to examine the formation of particles within carbon arcs and again the results are different from what is found with metallic electrodes, the particles being larger with rougher surfaces. The ultimate aim of this paper was to gain new knowledge concerning these arcs and their consequences for electrical safety (arc faults in wires).
  • Keywords
    X-ray scattering; arcs (electric); carbon; electrodes; plasma diagnostics; porous materials; C; arc characteristics; arc production; arc voltage; carbon arcs; circuit breaking; electric field breakdown; electrical safety; electrode direct sublimation; particle formation; porous carbon electrodes; small-angle X-ray scattering; Carbon; Electrodes; Graphite; Ignition; Materials; Scattering; Voltage measurement; Atmospheric pressure plasmas; X-ray scattering; dusty plasmas; electrical safety; nanoparticles; synchrotron radiation;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2013.2283581
  • Filename
    6630070