Title :
Multiangular Polarized Characteristics of Cirrus Clouds at 1380 nm
Author :
Cheng, Tianhai ; Gu, XingFa ; Chen, Liangfu ; Yu, Tao
Author_Institution :
State Key Lab. of Remote Sensing Sci., Jointly Sponsored by the Inst. of Remote Sensing Applic. of Chinese Acad. of Sci. & Beijing Normal Univ., Beijing
Abstract :
Cirrus clouds are known to play a key role in the Earth´s radiation budget and global climate change, the radiative effects of cirrus clouds depend critically on cloud properties such as optical thickness and particle shape and size. The studies of the optical, microphysical, and physical properties of cirrus have become the popular issue. This paper simulated the bidirectional reflectance distribution function (BRDF) and bidirectional polarization reflectance distribution function (BPDF) at 1380 nm in cirrus cloudy conditions on the basis of an adding-doubling radiative transfer program. Based on the sensitivity of 1380 nm spectral reflectance and polarization reflectance on cirrus optical thickness and aspect ratio, a conceptual approach has been developed to simultaneous retrieve the particle shape and optical thickness of cirrus clouds using the remote sensing data of multi-angular total and polarized at 1380 nm.
Keywords :
atmospheric optics; clouds; radiative transfer; BPDF; BRDF; Earth radiation budget; adding-doubling radiative transfer program; bidirectional polarization reflectance distribution function; bidirectional reflectance distribution function; cirrus clouds; global climate change; microphysical properties; multiangular polarized characteristics; optical thickness; particle shape; particle size; physical properties; radiative effects; remote sensing data; wavelength 1380 nm; Bidirectional control; Clouds; Distribution functions; Earth; Information retrieval; Optical polarization; Optical sensors; Reflectivity; Remote sensing; Shape; cirrus clouds microphysical parameter; cirrus clouds optical properties; multi-angular polarized radiance; vector radiative transfer;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
DOI :
10.1109/IGARSS.2008.4779887