Fault-Tolerant SOI Microprocessor for Space Applications

Author

Osipenko, Pavel N. ; Antonov, A.A. ; Klishin, Alexander V. ; Vasilegin, Boris V. ; Gorbunov, Maxim S. ; Dolotov, Pavel S. ; Zebrev, Gennady I. ; Anashin, Vasily S. ; Emeliyanov, Vladimir V. ; Ozerov, Alexander I. ; Chumakov, Alexander I. ; Yanenko, Andrey

Author_Institution

Sci. Res. Inst. of Syst. Anal., Moscow, Russia

Volume

60

Issue

4

fYear

2013

fDate

Aug. 2013

Firstpage

2762

Lastpage

2767

Abstract

The design and experimental results are presented for the fault-tolerant 0.35 ìm SOI CMOS microprocessor. DICE-like cells are shown to be vulnerable to SEU during “read” and “write” modes.

Keywords

CMOS digital integrated circuits; fault tolerance; microprocessor chips; silicon-on-insulator; DICE-like cells; SEU; complementary metal-oxide-semiconductor integrated circuits; dual interlocked storage cells; fault-tolerant SOI CMOS microprocessor; read modes; silicon-on-insulator; single-event upset; space applications; write modes; Fault tolerance; Fault tolerant systems; Microprocessors; Registers; Single event upset; Transistors; Tunneling magnetoresistance; CMOS; RHBD; Single-Event Upset (SEU); critical charge; dual interlocked storage (DICE); heavy ions; microprocessor; read mode; silicon-on-insulator (SOI); write mode;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2013.2241453

Filename

6457427