• DocumentCode
    484705
  • Title

    Effect of the Unwrapping Process on the Correlations Among InSAR Differences for the Same Area

  • Author

    Ballatore, P. ; Wasowski, J.

  • Author_Institution
    MARSec, Benevento
  • Volume
    4
  • fYear
    2008
  • fDate
    7-11 July 2008
  • Abstract
    Differences among SAR interferograms (InSAR) represent an important tool for the measurement of natural and maninduced surface deformations. If not important terrain movements are observed during the considered time interval, largest differences are mostly interpreted in terms of atmospheric effects. Otherwise, smaller differences can be interpreted in terms of interseismic terrain landslides or other generic land cover or ground surface changes. In particular, significant correlations among InSAR differences and/or with the topography are reported in previous papers. In some cases, these are interpreted in terms of atmospheric or geological mechanisms. In this paper, a relationship between the unwrapping process and the correlations among InSAR and InSAR differences is observed. It is concluded that these correlations can be, at least partially, of non-geophysical origin, driven by computational procedures.
  • Keywords
    deformation; geomorphology; radar interferometry; seismology; synthetic aperture radar; topography (Earth); InSAR images; Interferometry of Synthetic Aperture Radar; atmospheric mechanism; generic land cover; geological mechanism; ground surface changes; interseismic terrain landslides; man-induced surface deformation measurement; natural surface deformation measurement; topography; unwrapping process; Area measurement; Atmospheric measurements; Buildings; Geologic measurements; Geology; Land surface; Radar tracking; Surface topography; Synthetic aperture radar interferometry; Terrain factors; Synthetic aperture radar interferometry; correlations; phase unwrapping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-2807-6
  • Electronic_ISBN
    978-1-4244-2808-3
  • Type

    conf

  • DOI
    10.1109/IGARSS.2008.4779949
  • Filename
    4779949