Title :
Investigation of 14 MeV Neutron Capabilities for SEU Hardness Evaluation
Author :
Miller, Florent ; Weulersse, C. ; Carriere, T. ; Guibbaud, Nicolas ; Morand, S. ; Gaillard, R.
Author_Institution :
EADS France, Suresnes, France
Abstract :
This work investigates the capabilities of 14 MeV neutron tests to characterize the Single Event Upset sensitivity of digital devices. Analysis of secondary ions, experimental tests and extrapolation thanks to nuclear databases are performed to support the work.
Keywords :
hardness testing; neutron sources; SEU hardness evaluation; digital devices; electron volt energy 14 MeV; extrapolation; neutron tests; nuclear databases; single event upset sensitivity; Generators; Ions; Neutrons; Radiation effects; Random access memory; Sensitivity; Silicon; 14 MeV neutrons; neutron-induced Single Event Upset (SEU);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2241078
