• DocumentCode
    48556
  • Title

    Multiple Module Pixellated CdTe Spectroscopic X-Ray Detector

  • Author

    Wilson, Matthew D. ; Bell, S.J. ; Cernik, Robert J. ; Christodoulou, Christos ; Egan, C.K. ; O´Flynn, D. ; Jacques, S. ; Pani, Silvia ; Scuffham, J. ; Seller, Paul ; Sellin, P.J. ; Speller, R. ; Veale, Matthew C.

  • Author_Institution
    Sci. & Technol. Facilities Council, Rutherford Appleton Lab., Didcot, UK
  • Volume
    60
  • Issue
    2
  • fYear
    2013
  • fDate
    Apr-13
  • Firstpage
    1197
  • Lastpage
    1200
  • Abstract
    A pixellated CdTe detector system comprising 2×2 detector modules has been developed for high energy spectroscopic X-ray imaging applications and has an active area of 16 cm2 . The detector modules are made from the HEXITEC 80×80 ASIC and 1 mm thick CdTe with Al-Schottky contacts. The CdTe has 250 μm pitch pixels with an outer guard ring on the same pitch. The single HEXITEC 80×80 detectors have an average energy resolution (FWHM) of 800 eV at 59.9 keV. Limitations in the multiple module DAQ system mean that the energy resolution of the pixels in the 2×2 detector array is 2.0 keV at 59.9 keV. The spacing between the tiled detector modules is 150 μm which results in an inactive area equivalent to 3 pixels, including the guard ring on the edge of the detectors. The modular detector configuration demonstrates the potential to create large area detector arrays in the future.
  • Keywords
    Schottky barriers; X-ray apparatus; X-ray imaging; application specific integrated circuits; data acquisition; nuclear electronics; semiconductor counters; Al-Schottky contacts; HEXITEC ASIC; HEXITEC detectors; average energy resolution; electron volt energy 59.9 keV; high energy spectroscopic X-ray imaging applications; inactive area; large area detector arrays; modular detector configuration; multiple module DAQ system; multiple module pixellated CdTe spectroscopic X-ray detector; outer guard ring; pitch pixels; size 1 mm; size 150 mum; tiled detector modules; Application specific integrated circuits; Arrays; Data acquisition; Detectors; Image edge detection; Image quality; Imaging; CdTe; CdZnTe; X-ray detector; imaging; spectroscopic;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2013.2240694
  • Filename
    6457433