DocumentCode
48648
Title
Demonstration of a Micro-Integrated Sub-Millimeter-Wave Pixel
Author
Radisic, Vesna ; Leong, Kevin ; Chunbo Zhang ; Loi, K.K. ; Sarkozy, Stephen
Author_Institution
Northrop Grumman Corp., Redondo Beach, CA, USA
Volume
61
Issue
8
fYear
2013
fDate
Aug. 2013
Firstpage
2949
Lastpage
2955
Abstract
This paper reports on the first demonstration of a micro-integrated pixel operating in the sub-millimeter-wave regime. The pixel consists of a low-noise amplifier realized in InP HEMT, an nIN diode detector, and micromachined horn antenna. The monolithic microwave integrated circuits are attached inside a micromachined silicon waveguide through a novel solder ball process, and a micromachined horn antenna caps the waveguide, which completes the pixel. The form factor is > 2500 × reduction from traditional waveguide block packaging. This size reduction, high level of integration, and integration with a horn antenna enables this technology to be scalable to compact 2-D arrays in the sub-millimeter-wave regime. The pixel noise temperature is measured to be ~5400 K, which corresponds to sensitivity of an ideal total-power radiometer (ΔTM) of ~0.21 K given a 30-ms integration time and bandwidth of 20 GHz.
Keywords
HEMT integrated circuits; III-V semiconductors; MMIC amplifiers; horn antennas; indium compounds; low noise amplifiers; packaging; HEMT; InP; diode detector; frequency 20 GHz; low-noise amplifier; micro-integrated sub-millimeter-wave pixel; micromachined horn antenna; micromachined waveguide; monolithic microwave integrated circuits; radiometer; solder ball; time 30 ms; waveguide block packaging; Antenna arrays; Cavity resonators; Detectors; Horn antennas; MMICs; Semiconductor diodes; Silicon; Detector; HEMT; InP; low-noise amplifier (LNA); microintegration; pixel; wafer-level packaging;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2013.2272379
Filename
6563110
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