DocumentCode :
48677
Title :
Impact of High-Mobility Materials on the Performance of Near- and Sub-Threshold CMOS Logic Circuits
Author :
Crupi, Felice ; Albano, Domenico ; Alioto, Massimo ; Franco, Jacopo ; Selmi, Luca ; Mitard, J. ; Groeseneken, Guido
Author_Institution :
Dipt. di Ing. Inf., Modellistica, Elettron. e Sist., Univ. della Calabria, Rende, Italy
Volume :
60
Issue :
3
fYear :
2013
fDate :
Mar-13
Firstpage :
972
Lastpage :
977
Abstract :
This paper studies the impact of high-mobility materials on the performance and energy efficiency of near- and sub-threshold CMOS logic circuits by means of analytical equations and experimental data on SiGe pMOSFETs. The introduction of high-mobility materials is shown to improve the energy-performance trade-off in near-threshold circuits more than in above-threshold circuits, since the benefits of higher mobility are degraded at higher longitudinal and transversal electric fields. On the other hand, results show that high-mobility materials do not exhibit any advantage in terms of the energy-performance trade-off in sub-threshold logic circuits. This is explained by the fact that the benefits brought by the larger mobility of SiGe or other alternative materials can be obtained by tuning the threshold voltage of conventional Si devices.
Keywords :
CMOS logic circuits; Ge-Si alloys; MOSFET; semiconductor materials; Si-Ge; energy efficiency; high-mobility material impact; longitudinal electric field; near-threshold CMOS logic circuits; silicon devices; silicon-germanium pMOSFET; sub-threshold CMOS logic circuits; threshold voltage tuning; transversal electric field; CMOS integrated circuits; Logic gates; MOSFETs; Silicon; Silicon germanium; Very large scale integration; High-mobility materials; SiGe pMOSFETs; near-threshold CMOS circuits; sub-threshold CMOS circuits;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2240685
Filename :
6457444
Link To Document :
بازگشت