Title :
Analysis of Process Dynamics using Computer Memory and Controlled Resolution
Author_Institution :
Instrument and Electrical Department, Dow Chemical Company, P.O. Box 150, Plaquemine, Louisiana 70764; Adjunct Professor, Dept. of Electrical Engineering, University of Toronto
Abstract :
Global economic forces and plentiful computer resources are forming in industry a "service" paradigm of signals and dynamic systems which is different in nature from the traditional "test bench" paradigm of systems design. It is aligned with the new mission of production organizations: continual improvement in product quality and the productivity of operations. With this paper, the intention is to communicate key aspects of the service perspective and to advance technical ideas toward the development of signal analysis tools which will help production organizations achieve their new mission.
Keywords :
Chemical engineering; Chemical industry; Computer industry; Globalization; Instruments; Production; Productivity; Signal processing; Signal resolution; System testing;
Conference_Titel :
American Control Conference, 1988
Conference_Location :
Atlanta, Ga, USA