• DocumentCode
    48732
  • Title

    Capacitor-Less Gate Drive Circuit Capable of High-Efficiency Operation for Non-Insulating-Gate GaN FETs

  • Author

    Hattori, Fumiya ; Umegami, Hirokatsu ; Yamamoto, Manabu

  • Author_Institution
    Dept. of Electron. & Control Syst. Eng., Shimane Univ., Matsue, Japan
  • Volume
    60
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    3249
  • Lastpage
    3255
  • Abstract
    Recently, Gallium Nitride (GaN) power devices have become very attractive because of their high power density. GaN FETs, however, differ from MOSFETs, and it is possible that GaN-based power electronics circuits show lower efficiency than Si-based circuits because of their unique characteristics. A capacitor-less gate drive circuit is proposed as a solution. This paper shows the effectiveness of a capacitor-less gate circuit in terms of gate drive loss, reverse conduction loss, and recovery loss, and compares it with capacitor-type gate drive circuits for GaN FETs. Drive loss analysis of an inverted gate drive circuit showing the lowest losses among capacitor-type gate drive circuits and a capacitor-less gate drive circuit was made to examine the differences between them. The results show that higher efficiency operation is obtained by applying a capacitor-less gate drive circuit to simple test circuits.
  • Keywords
    III-V semiconductors; driver circuits; elemental semiconductors; gallium compounds; power electronics; power field effect transistors; silicon; wide band gap semiconductors; GaN; MOSFET; Si; capacitor-less gate drive circuit; capacitor-type gate drive circuits; gate drive loss; high power density; high-efficiency operation; inverted gate drive circuit; non-insulating-gate FET; power devices; power electronics circuits; recovery loss; reverse conduction loss; Capacitors; Drives; Field effect transistors; Gallium nitride; Logic gates; Resistors; Threshold voltage; Capacitor-less gate drive circuit; gate drive loss; recovery loss; reverse conduction loss;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2272094
  • Filename
    6563120