DocumentCode :
487509
Title :
The Characterization of High Temperature Electronics for Future Aircraft Engine Digital Electronic Control Systems
Author :
Wiley, J.D. ; Dening, D C
Author_Institution :
U WISCONSIN MADISON, MADISON WISCONSIN 53706
fYear :
1988
fDate :
15-17 June 1988
Firstpage :
1831
Lastpage :
1836
Abstract :
The characterization of high temperature electronics is presented including high temperature effects, semiconductors and barrier metallizations. Design solutions and material selections for mitigation of high temperature effects are indicated. The following semiconductor materials are considered as future high temperature candidates: - Silicon (Si) - Gallium arsenide (GaAs) - Gallium phosphide (GaP) - Silicon carbide (SiC) - Diamond like carbon (C) This characterization was originally prepared in accordance with the USAF Future Advance Controls Technology Study (FACTS).
Keywords :
Aerospace electronics; Aircraft propulsion; Control systems; Digital control; Gallium arsenide; III-V semiconductor materials; Metallization; Semiconductor materials; Silicon carbide; Temperature control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference, 1988
Conference_Location :
Atlanta, Ga, USA
Type :
conf
Filename :
4790025
Link To Document :
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