• DocumentCode
    487631
  • Title

    Feedrate Optimization for Machine Tool Control Subject to Contour Error Constraints

  • Author

    Imamura, F. ; Kaufman, H.

  • Author_Institution
    Electrical, Computer and System Engineering Department, Rensselaer Polytechnic Institute, Troy, NY 12180-3590
  • fYear
    1989
  • fDate
    21-23 June 1989
  • Firstpage
    81
  • Lastpage
    86
  • Abstract
    Optimization techniques are applied to feedrate and voltage control in order to improve performance of biaxial contouring systems. This is done by maintaining contour error within a prescribed tolerance while tracking the trajectory in minimum time. In addition to the error constraint, the current and voltage constraints are required to keep the motors from overloading. The design of the controllers requires two steps. First, an LQR-type innerloop controller for the armature voltage is designed for each axis to assure stability using a performance index that penalizes current, armature voltage, and axial error. Next, nonlinear programming techniques are used to find the outerloop control or feedrate profile (which determines the tracking time) and the weighting matrices (which determine the innerloop controller gains) subject to voltage, current, and two-dimensional contour error constraints for a given trajectory. Although the innerloop controllers are originally designed to minimize a weighted sum of axial error, current, and voltage, the outerloop optimization of the feedrate takes into account the two-dimensional contour error explicitly. In this manner, it is possible to tune the controllers to a particular trajectory to achieve the best performance. The method is tested via simulation using a model of a representative biaxial DC motor contouring system for an elliptical trajectory.
  • Keywords
    Constraint optimization; DC motors; Design optimization; Error correction; Machine tools; Performance analysis; Stability; System testing; Trajectory; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 1989
  • Conference_Location
    Pittsburgh, PA, USA
  • Type

    conf

  • Filename
    4790170