Title :
A Knowledge based Approach to Malfunction Diagnosis of Discrete Operations Involving Programmable Logic Controllers
Author :
Myers, Douglas R. ; Davis, James F. ; Harley, Charles E.
Author_Institution :
The Ohio State University, Department of Chemical Engineering, Columbus, Ohio
Abstract :
Discrete processes controlled by programmable logic controllers involve two distinct diagnostic scenarios: dead state and degrading performance. This paper details a dual-hierarchical expert system approach which performs process diagnosis for both scenarios. Diagnosis of either scenario is classificatory in nature, using one of two specialized Sequential-Functional hierarchies.
Keywords :
Chemical industry; Degradation; Industrial control; Logic devices; Logic testing; Machinery production industries; Programmable control; Programmable logic arrays; Programmable logic devices; Switches;
Conference_Titel :
American Control Conference, 1990
Conference_Location :
San Diego, CA, USA
