Title :
Robust and Optimal Identification in the l1 Norm
Author :
Tse, D.N.C. ; Dahleh, M.A. ; Tsitsiklis, J.N.
Author_Institution :
Laboratory for Information and Decision Systems, MIT, Cambridge, MA 02139
Keywords :
Gain measurement; Laboratories; Measurement uncertainty; Noise measurement; Noise robustness; Particle measurements; Performance evaluation; Robust control; Robust stability; Signal processing;
Conference_Titel :
American Control Conference, 1991
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-87942-565-2