Title :
A Time Domain Approach to Robustness of Linear Sampled Data Systems
Author :
Piou, Jean E. ; Sobel, Kenneth M. ; Shapiro, E.Y.
Author_Institution :
Dept. of Electrical Engineering, The City College of New York, New York, NY 10031
Keywords :
Cities and towns; Closed loop systems; Educational institutions; Eigenvalues and eigenfunctions; Robust stability; Robustness; Sampled data systems; Time varying systems; Uncertainty; Vectors;
Conference_Titel :
American Control Conference, 1992
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-0210-9
