DocumentCode
489838
Title
Output Prediction in Presence of Systematic Model Mismatch
Author
Agarwal, Mukul
Author_Institution
TCL, Eidgenössische Technische Hochschule, CH-8092 Zurich. Phone: +41 1 256 3113 Fax: +41 1 252 0975, Email: agarwal@csheth5a.bitnet
fYear
1992
fDate
24-26 June 1992
Firstpage
2435
Lastpage
2439
Abstract
In system identification for output prediction, unknown systematic errors in the measurement model and systematic drifts in the parameters have conventionally been treated with ad-hoc methods like exponential forgetting and moving windows. Such devices, although useful for zero-mean random errors and slow drifts, yield "arbitrary" tuning-dependent parameter estimates and output predictions in the realistic case of systematic model mismatch. This work presents a new method that yields optimal output predictions in face of systematic errors and drifts, without involving the arbitrariness of any user-specified tuning knobs.
Keywords
Delay effects; Delay estimation; Error correction; Measurement errors; Parameter estimation; Predictive models; Sampling methods; System identification; Vectors; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 1992
Conference_Location
Chicago, IL, USA
Print_ISBN
0-7803-0210-9
Type
conf
Filename
4792576
Link To Document