• DocumentCode
    489838
  • Title

    Output Prediction in Presence of Systematic Model Mismatch

  • Author

    Agarwal, Mukul

  • Author_Institution
    TCL, Eidgenössische Technische Hochschule, CH-8092 Zurich. Phone: +41 1 256 3113 Fax: +41 1 252 0975, Email: agarwal@csheth5a.bitnet
  • fYear
    1992
  • fDate
    24-26 June 1992
  • Firstpage
    2435
  • Lastpage
    2439
  • Abstract
    In system identification for output prediction, unknown systematic errors in the measurement model and systematic drifts in the parameters have conventionally been treated with ad-hoc methods like exponential forgetting and moving windows. Such devices, although useful for zero-mean random errors and slow drifts, yield "arbitrary" tuning-dependent parameter estimates and output predictions in the realistic case of systematic model mismatch. This work presents a new method that yields optimal output predictions in face of systematic errors and drifts, without involving the arbitrariness of any user-specified tuning knobs.
  • Keywords
    Delay effects; Delay estimation; Error correction; Measurement errors; Parameter estimation; Predictive models; Sampling methods; System identification; Vectors; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 1992
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    0-7803-0210-9
  • Type

    conf

  • Filename
    4792576