Title :
A Method for Verifying Measurements and Models of Linear and Nonlinear Systems
Author :
Wang, Feei ; Abramovitch, Daniel ; Franklin, Gene
Author_Institution :
Hewlett-Packard Laboratories, 1501 Page Mill Road, M/S 2U, Palo Alto, CA 94304; Ph.D. candidate, Information Systems Lab, joint research at HP Labs under Hewlett-Packard´´s SEED program. Phone: (415) 857-7807
Abstract :
A method has been developed to help verify system models and measurements and identify system nonlinearities. This method involves measuring the response of physical systems with a swept sine measurement device, such as the HP3562(3) A Control Systems Analyzer (CSA)1, and simulating system models with a dynamic system simulation tool, such as SIMULINK, using swept sine input. The input-output time sequences obtained from the simulations are analyzed in a similar fashion as done by the CSA to enable more accurate comparisons. A parallelism between swept sine measurements and describing functions is exploited to allow this method to be used in identifying nonlinear systems. Using the measured and simulated frequency response functions as a guide the designer can iteratively improve the model of the system and verify the correctness of the measurements.
Keywords :
Analytical models; Control system analysis; Costs; Frequency domain analysis; Frequency measurement; Frequency response; Laboratories; Milling machines; Nonlinear systems; Parametric statistics;
Conference_Titel :
American Control Conference, 1993
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-0860-3
