DocumentCode :
490769
Title :
Coil & Transformer Automatic Test Equipment (ATE) System
Author :
Ihara, F. ; Kobayashi, Kaoru ; Yokoyama, H. ; Iwasaki, S. ; Kinoshita, O.
Author_Institution :
Fujitsu Denso Ltd., 237, Sakato, Takatsu-ku, Kawasaki, Japan
fYear :
1983
fDate :
18-21 Oct. 1983
Firstpage :
413
Lastpage :
420
Abstract :
This paper describes the ATE System, which includes a microprocessor and is used for measuring the properties of coils and transformers. To accurately test D. U. T. with many specifications, the ATE System provides the following hardware test technologies: (1) The turn ratio measurement method, which is relatively unaffected by the transformer coupling coefficient. (2) The scanner bus line configuration, which achieved a 3-kV AC dielectric strength and 105-megohm insulation. (3) The winding polarity measurement method, which is relatively unaffected by transformer leakage inductance. The ATE System also provides software tests. This paper reports on the following software technologies: (1) The results of using CP/M as the operating system. (2) Using the menu system for easing operation.
Keywords :
Automatic test equipment; Coils; Dielectric breakdown; Dielectric measurements; Hardware; Inductance measurement; Insulation testing; Microprocessors; Power transformer insulation; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Telecommunications Energy Conference, 1983. INTELEC '83. Fifth International
Conference_Location :
Tokyo, Japan
Type :
conf
Filename :
4793852
Link To Document :
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