• DocumentCode
    492096
  • Title

    Fuzzy Controller Design for Atomic Force Microscope System

  • Author

    Yau, Her-Terng ; Wang, Cheng-Chi ; Kuo, Chao-Lin ; Jang, Ming-Jyi ; Su, Yuan-Hung

  • Author_Institution
    Dept. of Electr. Eng., Far East Univ., Tainan
  • fYear
    2008
  • fDate
    21-22 Dec. 2008
  • Firstpage
    83
  • Lastpage
    87
  • Abstract
    This paper presents the design of a nonlinear rule based fuzzy logic controller for the nonlinear dynamic behavior of the probe tip of an atomic force microscope system (AFMs). At first, we use the bifurcation diagram to analysis the complex dynamic behavior of the atomic force microscope system. Next, the positive maximum Lyapunov exponent is obtained to identify that the chaotic motion do exist in AFMs. In order to suppress the undesired chaotic motion in AFMs, we address the design schemes of fuzzy logic controller to stabilize the slave chaotic AFMs to the master periodic AFMs. In the controller design process, it directly constructs the fuzzy rules subject to a common Lyapunov function such that the error dynamics of master and slave AFMs satisfy stability in the Lyapunov sense. It overcomes the trial-and-error tuning for the membership functions and rule base in traditional fuzzy logic control. Finally, a numerical simulation is used to illustrate the effectiveness of the proposed controller.
  • Keywords
    Lyapunov methods; atomic force microscopy; control system synthesis; fuzzy control; nonlinear control systems; optical microscopes; atomic force microscope system; bifurcation diagram; chaotic motion; complex dynamic behavior; fuzzy controller design; nonlinear dynamic behavior; positive maximum Lyapunov exponent; Atomic force microscopy; Chaos; Control systems; Force control; Fuzzy control; Fuzzy logic; Fuzzy systems; Master-slave; Nonlinear control systems; Nonlinear dynamical systems; AFM; bifurcation; chaotic motion; fuzzy controller;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Knowledge Acquisition and Modeling Workshop, 2008. KAM Workshop 2008. IEEE International Symposium on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-3530-2
  • Electronic_ISBN
    978-1-4244-3531-9
  • Type

    conf

  • DOI
    10.1109/KAMW.2008.4810430
  • Filename
    4810430