Title :
Access Discovery in Always Best Connected Networks
Author :
Chen, Yiping ; Deng, Chen ; Yang, Yuhang
Author_Institution :
Dept. of Electron. Inf., Shanghai Univ. of Eng. Sci., Shanghai
Abstract :
It is widely recognized that fourth generation mobile communication systems will be built upon all-IP architectures with various radio access networks. The existence of multiple access networks provides users possibilities to connect to the access network which best suits their application needs at any given time and location. This concept is often called by "always best connected". Access discovery is the process not only to find available access networks or access devices for ABC terminals, but also to get the available resource information for applications. However, current access discovery schemes do not meet the requirements of access discovery in ABC networks. In this study, we propose two access discovery schemes to solve the problem mentioned above. One is terminal-based access discovery. The other is network-based access discovery. Through analysis and simulation, network-based access discovery brings user equipments a great improvement on power consumption comparing with terminal-based access discovery.
Keywords :
4G mobile communication; IP networks; radio access networks; resource allocation; ABC networks; ABC terminals; Always Best Connected networks; IP architectures; access discovery; fourth generation mobile communication systems; multiple access networks; power consumption; radio access networks; resource information; terminal-based access discovery; 3G mobile communication; 4G mobile communication; Analytical models; Availability; Bandwidth; Delay; Energy consumption; Radio access networks; Radio broadcasting; Wireless LAN; Access Discovery; Always Best Connected; fourth generation mobile communication;
Conference_Titel :
Knowledge Acquisition and Modeling Workshop, 2008. KAM Workshop 2008. IEEE International Symposium on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-3530-2
Electronic_ISBN :
978-1-4244-3531-9
DOI :
10.1109/KAMW.2008.4810610