• DocumentCode
    492575
  • Title

    The effect of program and model structure on mc/dc test adequacy coverage

  • Author

    Rajan, Ajitha ; Whalen, Michael W. ; Heimdahl, Mats P E

  • Author_Institution
    Dept. of Comp. Sci. & Eng., Univ. of Minnesota, MN
  • fYear
    2008
  • fDate
    10-18 May 2008
  • Firstpage
    161
  • Lastpage
    170
  • Abstract
    In avionics and other critical systems domains, adequacy of test suites is currently measured using the MC/DC metric on source code (or on a model in model-based development). We believe that the rigor of the MC/DC metric is highly sensitive to the structure of the implementation and can therefore be misleading as a test adequacy criterion. We investigate this hypothesis by empirically studying the effect of program structure on MC/DC coverage. To perform this investigation, we use six realistic systems from the civil avionics domain and two toy examples. For each of these systems, we use two versions of their implementation-with and without expression folding (i.e., inlining). To assess the sensitivity of MC/DC to program structure, we first generate test suites that satisfy MC/DC over a non-inlined implementation. We then run the generated test suites over the inlined implementation and measure MC/DC achieved. For our realistic examples, the test suites yield an average reduction of 29.5% in MC/DC achieved over the inlined implementations at 5% statistical significance level.
  • Keywords
    avionics; program testing; software metrics; source coding; MC-DC test adequacy coverage; civil avionics; expression folding; model-based development; modified condition and decision coverage criterion; program structure; source code; Aerospace electronics; Certification; Computer industry; Current measurement; DC generators; Logic testing; NASA; Permission; Software testing; System testing; structural coverage metrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering, 2008. ICSE '08. ACM/IEEE 30th International Conference on
  • Conference_Location
    Leipzig
  • ISSN
    0270-5257
  • Print_ISBN
    978-1-4244-4486-1
  • Electronic_ISBN
    0270-5257
  • Type

    conf

  • DOI
    10.1145/1368088.1368111
  • Filename
    4814127