DocumentCode
492579
Title
An empirical study of the effects of test-suite reduction on fault localization
Author
Yu, Yanbing ; Jones, James A. ; Harrold, Mary Jean
Author_Institution
Coll. of Comput., Georgia Inst. of Technol., Atlanta, GA
fYear
2008
fDate
10-18 May 2008
Firstpage
201
Lastpage
210
Abstract
Fault-localization techniques that utilize information about all test cases in a test suite have been presented. These techniques use various approaches to identify the likely faulty part(s) of a program, based on information about the execution of the program with the test suite. Researchers have begun to investigate the impact that the composition of the test suite has on the effectiveness of these fault-localization techniques. In this paper, we present the first experiment on one aspect of test-suite composition--test-suite reduction. Our experiment studies the impact of the test-suite reduction on the effectiveness of fault-localization techniques. In our experiment, we apply 10 test-suite reduction strategies to test suites for eight subject programs. We then measure the differences between the effectiveness of four existing fault-localization techniques on the unreduced and reduced test suites. We also measure the reduction in test-suite size of the 10 test-suite reduction strategies. Our experiment shows that fault-localization effectiveness varies depending on the test-suite reduction strategy used, and it demonstrates the trade-offs between test-suite reduction and fault-localization effectiveness.
Keywords
program testing; software fault tolerance; fault-localization techniques; program execution; program testing; test-suite reduction strategy; Educational institutions; Fault diagnosis; Permission; Size measurement; Software debugging; Software engineering; Software testing; empirical study; fault localization; test-suite reduction;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering, 2008. ICSE '08. ACM/IEEE 30th International Conference on
Conference_Location
Leipzig
ISSN
0270-5257
Print_ISBN
978-1-4244-4486-1
Electronic_ISBN
0270-5257
Type
conf
DOI
10.1145/1368088.1368116
Filename
4814131
Link To Document