• DocumentCode
    492579
  • Title

    An empirical study of the effects of test-suite reduction on fault localization

  • Author

    Yu, Yanbing ; Jones, James A. ; Harrold, Mary Jean

  • Author_Institution
    Coll. of Comput., Georgia Inst. of Technol., Atlanta, GA
  • fYear
    2008
  • fDate
    10-18 May 2008
  • Firstpage
    201
  • Lastpage
    210
  • Abstract
    Fault-localization techniques that utilize information about all test cases in a test suite have been presented. These techniques use various approaches to identify the likely faulty part(s) of a program, based on information about the execution of the program with the test suite. Researchers have begun to investigate the impact that the composition of the test suite has on the effectiveness of these fault-localization techniques. In this paper, we present the first experiment on one aspect of test-suite composition--test-suite reduction. Our experiment studies the impact of the test-suite reduction on the effectiveness of fault-localization techniques. In our experiment, we apply 10 test-suite reduction strategies to test suites for eight subject programs. We then measure the differences between the effectiveness of four existing fault-localization techniques on the unreduced and reduced test suites. We also measure the reduction in test-suite size of the 10 test-suite reduction strategies. Our experiment shows that fault-localization effectiveness varies depending on the test-suite reduction strategy used, and it demonstrates the trade-offs between test-suite reduction and fault-localization effectiveness.
  • Keywords
    program testing; software fault tolerance; fault-localization techniques; program execution; program testing; test-suite reduction strategy; Educational institutions; Fault diagnosis; Permission; Size measurement; Software debugging; Software engineering; Software testing; empirical study; fault localization; test-suite reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering, 2008. ICSE '08. ACM/IEEE 30th International Conference on
  • Conference_Location
    Leipzig
  • ISSN
    0270-5257
  • Print_ISBN
    978-1-4244-4486-1
  • Electronic_ISBN
    0270-5257
  • Type

    conf

  • DOI
    10.1145/1368088.1368116
  • Filename
    4814131