DocumentCode :
492762
Title :
Crosstalk avoidance method considering multi-aggressors
Author :
Jung, Sibaek ; Zang, Naeun ; Park, Eunsuk ; Kim, Juho
Author_Institution :
Design Autom. Team, Hynix Semicond. Inc., Icheon
Volume :
02
fYear :
2008
fDate :
24-25 Nov. 2008
Abstract :
This As manufacturing technology scales to smaller dimensions, wire size is increasing and spacing between wires is decreasing, the influence of interconnect becomes dominant factor. Coupling capacitance between wires induces crosstalk. Crosstalk causes functional and temporal problem. In this paper, we propose timing window shift method considering multi-aggressors to reduce delay degradation. We assume that crosstalk induced delay degradation is proportional to coupling capacitance and timing window overlap. In this assumption, we model Aggressive Factor which represents the amount of crosstalk induced delay degradation. Proposed method is experimented with ISCAS85 benchmark circuit. We have a result that average of 4.85% crosstalk induced delay degradation minimization.
Keywords :
capacitance; crosstalk; delays; interconnections; logic gates; ISCAS85 benchmark circuit; aggressive factor; coupling capacitance; crosstalk avoidance method; delay degradation; interconnect; multi-aggressors; timing window shift method; Capacitance; Coupling circuits; Crosstalk; Degradation; Delay; Integrated circuit interconnections; Manufacturing; Minimization; Timing; Wires; crosstalk; multi-aggressors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SoC Design Conference, 2008. ISOCC '08. International
Conference_Location :
Busan
Print_ISBN :
978-1-4244-2598-3
Electronic_ISBN :
978-1-4244-2599-0
Type :
conf
DOI :
10.1109/SOCDC.2008.4815708
Filename :
4815708
Link To Document :
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