Title :
Embedded testing for SOC functionality
Author :
Hahanov, Vladimir ; Pokrova, Sophia ; Yves, Tiecoura ; Gorobets, Andriy
Author_Institution :
Kharkov Nat. Univ. of Radioelectron., Kharkov, Ukraine
Abstract :
Innovative testable design technologies of hardware and software, which oriented on making graph models of SoC components for effective test development and SoC component verification, are considered.
Keywords :
graph theory; integrated circuit design; integrated circuit testing; system-on-chip; SOC functionality; SoC component verification; embedded testing; graph models; testable design technologies; Digital systems; Embedded software; Hardware; Software libraries; Software maintenance; Software standards; Software testing; Space technology; System testing; System-on-a-chip;
Conference_Titel :
CAD Systems in Microelectronics, 2009. CADSM 2009. 10th International Conference - The Experience of Designing and Application of
Conference_Location :
Lviv-Polyana
Print_ISBN :
978-966-2191-05-9
