DocumentCode
492836
Title
Electronic apparatus automation inspection with adaptive clustering in wavelet domain
Author
Shcherbakova, Galina ; Krylov, V. ; Antoshchuk, Svetlana
Author_Institution
Odessa Nat. Polytech. Univ., Odessa, Ukraine
fYear
2009
fDate
24-28 Feb. 2009
Firstpage
153
Lastpage
154
Abstract
The adaptive clustering in hyperbolic wavelet transforming domain is designed. Such approach allows inspected the production process of electronic apparatus in case of parameters correlation and high level noise.
Keywords
automatic testing; electronic products; inspection; wavelet transforms; adaptive clustering; automatic inspection; electronic apparatus automation inspection; electronic apparatus production; hyperbolic wavelet transforming domain; parameter correlation; Clustering methods; Design automation; Inspection; Iterative methods; Manufacturing; Noise level; Optimization methods; Production; Programmable control; Wavelet domain; Adaptive clustering; electronic apparatus production control; hyperbolic wavelet transforming (HWT); noise;
fLanguage
English
Publisher
ieee
Conference_Titel
CAD Systems in Microelectronics, 2009. CADSM 2009. 10th International Conference - The Experience of Designing and Application of
Conference_Location
Lviv-Polyana
Print_ISBN
978-966-2191-05-9
Type
conf
Filename
4839789
Link To Document