Title :
Embedded diagnosis and repairing of SoC memory
Author :
Hahanov, Vladimir ; Litvinova, Eugenia ; Umerah, Ngene Christopher ; Guz, Olesya
Author_Institution :
Comput. Eng. Fac., Kharkov Nat. Univ. of Radioelectron., Kharkov, Ukraine
Abstract :
A method of optimal memory fault repair that differs from analogs by application of algebra-logical technology of fault covering by two-dimensional memory matrix topology is proposed. It enables to obtain minimal and full solutions for subsequent repair in real time, which is based on utilization of spares in the form of memory rows and columns.
Keywords :
algebra; digital storage; network topology; system-on-chip; SoC memory; algebra-logical technology; embedded diagnosis; optimal memory fault; two-dimensional memory matrix topology; Cost function; Fault diagnosis; Hardware; Intellectual property; Minimization methods; Phase measurement; Pins; System testing; System-on-a-chip; Topology;
Conference_Titel :
CAD Systems in Microelectronics, 2009. CADSM 2009. 10th International Conference - The Experience of Designing and Application of
Conference_Location :
Lviv-Polyana
Print_ISBN :
978-966-2191-05-9
