DocumentCode
493383
Title
Experimental and numerical analyses of flexible PCBs under various loading conditions
Author
Arruda, Luciano ; Bonadiman, Renato ; Josineto, Costa ; Freitas, Germano
Author_Institution
Inst. Nokia de Tecnol., Manaus
fYear
2009
fDate
26-29 April 2009
Firstpage
1
Lastpage
10
Abstract
This work will present case studies of three types of flexible printable circuits subjected to different loading conditions in order to evaluate their technologies regarding mechanical reliability. Typical causes of failure in electronic devices are associated with mechanical stress, moisture, heat from transportation and field use. Typically manufacturers carry out tests to evaluate the reliability of electronic components regarding these environmental loads. Common tools used for this evaluation, in early stages of design, are FEA (finite element analysis) and experimental laboratory tests. In this work simulation models were generated aiming at developing tools for early stages of design, and mechanical tests were performed to assess actual reliability of parts and also to provide information to evaluate the simulation models. The different types of failure in the flexible printed embedded circuits, such as delamination, will be presented. Failures due to high shear stresses in flex-rigid joints will also be evaluated. Experimental tests and computational simulation will also be applied in order to perform these evaluations.
Keywords
circuit reliability; circuit testing; failure analysis; finite element analysis; flexible electronics; internal stresses; mechanical testing; printed circuits; FEA; failure; finite element analysis; flexible printable circuits; loading conditions; mechanical reliability; mechanical stress; moisture; shear stress; Circuit simulation; Circuit testing; Computational modeling; Flexible printed circuits; Manufacturing; Moisture; Numerical analysis; Performance evaluation; Stress; Transportation;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
Conference_Location
Delft
Print_ISBN
978-1-4244-4160-0
Electronic_ISBN
978-1-4244-4161-7
Type
conf
DOI
10.1109/ESIME.2009.4938493
Filename
4938493
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