Title :
Interlaboratory Study of Eddy-Current Measurement of Excess-Carrier Recombination Lifetime
Author :
Blum, Adrienne L. ; Swirhun, James S. ; Sinton, Ronald A. ; Fei Yan ; Herasimenka, Stanislau ; Roth, T. ; Lauer, K. ; Haunschild, Jonas ; Lim, B. ; Bothe, Klaus ; Hameiri, Ziv ; Seipel, Bjoern ; Rentian Xiong ; Dhamrin, Marwan ; Murphy, John D.
Author_Institution :
Sinton Instrum., Boulder, CO, USA
Abstract :
Excess-carrier recombination lifetime is a key parameter in silicon solar cell design and production. With the vast international use and recent standardization (SEMI PV13) of eddy-current wafer and brick silicon lifetime test instruments, it is important to quantify the inter- and intralaboratory repeatability. This paper presents the results of an international interlaboratory study conducted with 24 participants to determine the precision of the SEMI PV13 eddy-current carrier lifetime measurement test method. Overall, the carrier recombination lifetime between-laboratory reproducibility was found to be within ±11% for the quasi-steady-state mode and ±8% for transient mode for wafer samples, and within ±4% for bulk samples.
Keywords :
carrier lifetime; eddy current testing; elemental semiconductors; silicon; solar cells; standardisation; SEMI PV13 eddy-current carrier lifetime measurement; Si; brick silicon lifetime test; eddy-current wafer; excess-carrier recombination lifetime; interlaboratory repeatability; intralaboratory repeatability; quasisteady-state mode; silicon solar cell design; standardization; transient mode; Atmospheric measurements; Electrical resistance measurement; Instruments; Laboratories; Particle measurements; Standards; Transient analysis; Charge carrier lifetime; eddy currents; photoconductivity; silicon;
Journal_Title :
Photovoltaics, IEEE Journal of
DOI :
10.1109/JPHOTOV.2013.2284375
