Robustness optimization of MEMS-based reflectarray phase-shifting cells

This paper proposes a design procedure for optimizing MEMS-based phase-shifting cells for reflectarrays. A quantitative factor, named cumulative root mean square error, is used to quantify the average phase error resulting from random MEMS breakdowns in the cell. It permits to assess the cell robustness to MEMS failure and provides a convenient means of comparing different possible cell´s topologies. As an illustration, it is used to minimize the number of MEMS in the cell while preserving the necessary redundancy to limit phase errors.