DocumentCode :
494371
Title :
Research on Optimal Analysis Window Size and Resampling Method According to DEM Analysis Scale
Author :
Tao, Yang ; Tang, Guoan ; JIA, Yini ; GAO, Yiping
Author_Institution :
Key Lab. of Virtual Geographic Environ., Nanjing Normal Univ. Nanjing, Nanjing
Volume :
1
fYear :
2008
fDate :
21-22 Dec. 2008
Firstpage :
369
Lastpage :
372
Abstract :
The scale issue is one of the most important theory problems in digital terrain analysis and geo-science analysis. The accurate extraction of DEM terrain parameters according to right DEM analysis scale and the acquisition of the experienced threshold of DEM modeling rely on the selection of the optimal analysis window size. Current research indicates that the analysis window size is hard to accurately be selected in DEM based on different analysis scales. This paper presents a new algorithm of selecting the right analysis window size in original DEM analysis scale basing on an improved local variance measurement. Using statistics characteristics of local variance fitting curves, it can be concluded that the Bilinear Interpolation method is the optimal DEM resampling model of DEM scale analysis and the Regular Resample method can not effectively construct series of DEM that contains scale characteristics the same as original DEM data. The conclusions are validated by the results of different terrain test areas.
Keywords :
digital elevation models; geographic information systems; interpolation; sampling methods; terrain mapping; DEM analysis scale; bilinear interpolation; digital elevation models; digital terrain analysis; geo-science analysis; optimal analysis window size; resampling method; Algorithm design and analysis; Analysis of variance; Analytical models; Data mining; Educational technology; Geoscience and remote sensing; Image resolution; Size measurement; Spatial resolution; Statistical analysis; Analysis Scale; Analysis Window Size; DEM; Local Variance; Resampling Method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Education Technology and Training, 2008. and 2008 International Workshop on Geoscience and Remote Sensing. ETT and GRS 2008. International Workshop on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3563-0
Type :
conf
DOI :
10.1109/ETTandGRS.2008.15
Filename :
5070173
Link To Document :
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