Title :
Diagnosis of interconnect shorts in mesh NoCs
Author :
Hervé, Marcos ; Cota, Érika ; Kastensmidt, Fernanda Lima ; Lubaszewski, Marcelo
Author_Institution :
PPGC - PGMICRO - Inst. de Inf. / Escola de Eng., Univ. Fed. do Rio Grande do Sul, Porto Alegre
Abstract :
We propose a method to diagnose interconnect short-circuit faults in mesh NoCs. The fault model comprises all shorts between any two wires of a defined NoC neighborhood. Test sequences are applied in NoC functional mode. Experimental results show that 93% of the interconnect shorts can be diagnosed.
Keywords :
fault diagnosis; integrated circuit interconnections; integrated circuit testing; network-on-chip; NoC functional mode; interconnect short circuit fault diagnosis; mesh NoC neighborhood; test sequence; Fault detection; Fault diagnosis; Logic; Network-on-a-chip; Redundancy; Routing; Switches; System testing; System-on-a-chip; Wires;
Conference_Titel :
Networks-on-Chip, 2009. NoCS 2009. 3rd ACM/IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4142-6
Electronic_ISBN :
978-1-4244-4143-3
DOI :
10.1109/NOCS.2009.5071475
