Title :
Optimization of interconnects for signal integrity using self - adaptation in real - parameter genetic algorithms with simulated binary cross over (SBX)
Author :
Sabanayagam, A. ; Kumar, V. Abhai ; Raju, S. ; Kumar, N. Suresh
Author_Institution :
Dept. of ECE, Thiagarajar Coll. of Eng., Madurai, India
Abstract :
Signal integrity is the ability of a signal to generate correct responses in the circuit. High speed interconnect is the one in which the time taken by the propagating signal to travel between its end points cannot be neglected. High Speed Interconnects are modeled as Planar Transmission Line Structures. Analysis and design of interconnections in high-speed VLSI chips and printed circuit boards are gaining importance because of the rapid increase in operating frequencies and decrease in feature sizes. Improperly designed interconnects can result in increased crosstalk, signal delay, ringing, inadvertent and false switching. In order to reduce adverse signal integrity effects it is necessary for the interconnects to have accurate physical dimensions which as a result reduces unwanted coupling between neighboring conductors of the interconnects. In this paper, Genetic algorithm based approach with SBX to find optimal solution for physical dimensions of High speed interconnects, in the form of coupled micro strip line is presented.
Keywords :
VLSI; crosstalk; genetic algorithms; integrated circuit interconnections; microstrip lines; transmission lines; VLSI chips; coupled microstrip line; crosstalk; false switching; genetic algorithms; high speed interconnect; interconnect optimization; planar transmission line structures; printed circuit boards; ringing; signal delay; signal integrity; simulated binary crossover; Circuit simulation; Crosstalk; Frequency; Genetic algorithms; Integrated circuit interconnections; Planar transmission lines; Printed circuits; Signal design; Signal generators; Very large scale integration; Coupled Microstripline; Coupling Capacitance and Genetic Algorithm with SBX; Crosstalk; Mutual Inductance; Propagation delay;
Conference_Titel :
Electromagnetic Interference & Compatibility, 2008. INCEMIC 2008. 10th International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-81-903575-1-7