• DocumentCode
    494805
  • Title

    Uncertainty analysis for conducted emission measurement

  • Author

    Chakrabarti, Satyajit ; Dan, Dipankar ; Suresh, G.

  • Author_Institution
    SAMEER Kolkata Centre, Kolkata, India
  • fYear
    2008
  • fDate
    26-27 Nov. 2008
  • Firstpage
    251
  • Lastpage
    254
  • Abstract
    EMC measurements are inherently less accurate than most other types of measurement. Though the test houses are required to report or at least estimate their own measurement system uncertainty, there is no defined acceptable margin of uncertainty. In this paper a simple yet subtle technique to estimate the measurement uncertainty in conducted emission has been presented. The difficulty in calibrating line impedance stabilisation network (LISN) has been overcome by repeated measurement. Relevant measurement results have been presented. Overall uncertainty of conducted emission (CE) measurement has been estimated.
  • Keywords
    electromagnetic compatibility; measurement uncertainty; EMC measurements; conducted emission measurement; line impedance stabilisation network; measurement uncertainty; uncertainty analysis; Calibration; Electromagnetic compatibility; Frequency measurement; Impedance measurement; Insertion loss; Loss measurement; Measurement standards; Measurement uncertainty; Signal generators; System testing; Uncertainty; estimated calibration uncertainty of LISN; estimated uncertainty of CE measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Interference & Compatibility, 2008. INCEMIC 2008. 10th International Conference on
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-81-903575-1-7
  • Type

    conf

  • Filename
    5154262