• DocumentCode
    494812
  • Title

    Study of conducted emission measurement for equipment with multiple supply ports

  • Author

    Santhosh Kumar, P. ; Salil, P. ; Subbarao, B.

  • Author_Institution
    EMC Div., Centre for Electromagn., Chennai, India
  • fYear
    2008
  • fDate
    26-27 Nov. 2008
  • Firstpage
    287
  • Lastpage
    289
  • Abstract
    It is common for the equipment under test (EUT) to have multiple input power ports. The International Commercial Standards on conducted emission (CE) specifies only about the measurement of the noise at individual power supply ports using line impedance stabilization network (LISN). The effect of the power supply ports other than the one which is tested, such as the noise getting on to the system via the other power supply ports or the low impedance path for the noise through the other ports bypassing the LISN, is often ignored. It is observed that the impedance at other power supply ports has a major influence on the noise measurement at the test port. In this paper effort is made to demonstrate the effect of other power supply ports on the test measurement. The measurement results with different configurations are presented here. The observations may be referred to the standard setting committee and considered for possible amendment in the standard during the revision.
  • Keywords
    electric noise measurement; power supply circuits; radiofrequency measurement; test equipment; RF noise measure; emission measurement; equipment under test; line impedance stabilization network; noise measurement; power supply port; Circuit testing; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic measurements; Impedance measurement; Measurement standards; Noise measurement; Power measurement; Power supplies; Radio frequency; Conducted Emission; LISN; Multiple power ports;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Interference & Compatibility, 2008. INCEMIC 2008. 10th International Conference on
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-81-903575-1-7
  • Type

    conf

  • Filename
    5154273