• DocumentCode
    495499
  • Title

    Orthogonal Experiment Data Analysis Based on Optimal Discrimination Plane and Its Application

  • Author

    Lu, Hong

  • Author_Institution
    Fac. of Inf. Eng., Jiangxi Univ. of Sci. & Technol., Ganzhou, China
  • Volume
    4
  • fYear
    2009
  • fDate
    March 31 2009-April 2 2009
  • Firstpage
    215
  • Lastpage
    219
  • Abstract
    It is difficult for conventional methods to analyze accurately the data of orthogonal experiment with multiple indexes and/or without blank lists. In this research, a new analysis method based on optimal discrimination plane (ODP) was proposed. For this method, two orthogonal vectors were firstly built up based on the Fisher´s criterion, and then the experiment data were projected onto the two vectors, thus, two-dimensional feature vectors were extracted as criteria to determine the factors effect degree on the indexes of orthogonal experiment. As an example, the experimental data of SIS hot-melt pressure sensitive adhesive properties were analyzed using this method. Results show that the proposed method can achieve results according with the practice, no matter how many indexes in orthogonal table and whether there are blank lists or not. Therefore, the ODP analysis method is effective to deal with orthogonal experiment data and can be applied widely to many fields.
  • Keywords
    feature extraction; pattern classification; pattern clustering; sampling methods; statistical testing; Fisher´s criterion method; ODP analysis method; SIS hot-melt pressure-sensitive adhesive property; blank list; clustering method; multicategory analysis process; multifactor test; multiple index; optimal discrimination plane; orthogonal experiment data analysis; orthogonal vector; pattern classification; sampling method; statistical pattern recognition; two-dimensional feature vector extraction; Algorithm design and analysis; Analysis of variance; Computer science; Data analysis; Data engineering; Equations; Error analysis; Feature extraction; Pattern analysis; Pattern recognition; data analysis; optimal discrimination plane; orthogonal experiment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Engineering, 2009 WRI World Congress on
  • Conference_Location
    Los Angeles, CA
  • Print_ISBN
    978-0-7695-3507-4
  • Type

    conf

  • DOI
    10.1109/CSIE.2009.112
  • Filename
    5170990