DocumentCode :
49565
Title :
Takagi–Sugeno Model Based Analysis of EWMA RtR Control of Batch Processes With Stochastic Metrology Delay and Mixed Products
Author :
Ying Zheng ; Wong, David Shan-Hill ; Yan-Wei Wang ; Huajing Fang
Author_Institution :
Key Lab. of Minist. of Educ. for Image Process. & Intell. Control, Huazhong Univ. of Sci. & Technol., Wuhan, China
Volume :
44
Issue :
7
fYear :
2014
fDate :
Jul-14
Firstpage :
1155
Lastpage :
1168
Abstract :
In many batch-based industrial manufacturing processes, feedback run-to-run control is used to improve production quality. However, measurements may be expensive and cannot always be performed online. Thus, the measurement delay always exists. The metrology delay will affect the stability and performance of the process. Moreover, since quality measurements are performed offline, delay is not fixed but is stochastic in nature. In this paper, a modeling approach Takagi-Sugeno (T-S) model is presented to handle stochastic metrology delay in both single-product and mixed-product processes. Based on the Markov characteristics of the delay, the membership of the T-S model is derived. Performance indices such as the mean and the variance of the closed-loop output of the exponentially weighted moving average (EWMA) control algorithm can be derived. A steady-state error of the process output always exists, which leads the output deviating from the target. To remove the steady-state error, an algorithm called compensatory EWMA run-to-run (COM-EWMA-RtR) algorithm is proposed. The validity of the T-S model analysis and the efficiency of the proposed COM-EWMA-RtR algorithm are confirmed by simulation.
Keywords :
Markov processes; batch processing (industrial); closed loop systems; delays; feedback; measurement uncertainty; moving average processes; performance index; quality control; stability; stochastic systems; COM-EWMA-RtR algorithm; EWMA RtR control; EWMA control algorithm; Markov characteristics; T-S model analysis; Takagi-Sugeno model based analysis; batch-based industrial manufacturing process; closed-loop output; compensatory EWMA run-to-run algorithm; exponentially weighted moving average control algorithm; feedback run-to-run control; measurement delay; mixed-product process; performance indices; production quality; quality measurements; single-product process; steady-state error; stochastic metrology delay; Analytical models; Batch production systems; Delays; Metrology; Process control; Stability analysis; Stochastic processes; Batch process; Takagi--Sugeno (T--S) model; Takagi??Sugeno (T??S) model; exponentially weighted moving average (EWMA); run-to-run control; stochastic metrology delay;
fLanguage :
English
Journal_Title :
Cybernetics, IEEE Transactions on
Publisher :
ieee
ISSN :
2168-2267
Type :
jour
DOI :
10.1109/TCYB.2013.2280908
Filename :
6631494
Link To Document :
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