• DocumentCode
    49583
  • Title

    Corrosion-Based Failure of Oxide-Aperture VCSELs

  • Author

    Herrick, Robert W. ; Dafinca, Alexandru ; Farthouat, Philippe ; Grillo, Alexander A. ; McMahon, Stephen J. ; Weidberg, Anthony R.

  • Author_Institution
    Dept. of Quality & Reliability, Intel Corp., Santa Clara, CA, USA
  • Volume
    49
  • Issue
    12
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    1045
  • Lastpage
    1052
  • Abstract
    Oxide vertical cavity surface emitting lasers (VCSELs) have been known to have a premature failure mode when operated in the presence of atmospheric water vapor, due to corrosion failure. However, information on the precise chain of failure has not previously been available. In this paper, we start by showing the field failure results in a large particle-physics application with 6,000 deployed channels. Next, evidence is shown for the chain of failure between the previously observed oxide aperture tip cracking and delamination, and how that appears to cause dark-line defect networks in the GaAs active region beneath the aperture. In addition, we show how corrosion can be monitored through spectral width narrowing and discuss other symptoms of corrosion-based degradation that show up hundreds or thousands of hours before the rapid failure takes place. Finally, possible ways of preventing corrosion-based failure are discussed.
  • Keywords
    III-V semiconductors; corrosion; crack-edge stress field analysis; delamination; gallium arsenide; laser cavity resonators; surface emitting lasers; GaAs; atmospheric water vapor; corrosion-based failure; dark-line defect networks; delamination; oxide aperture tip cracking; oxide vertical cavity surface emitting lasers; oxide-aperture VCSEL; premature failure mode; spectral width narrowing; Aging; Apertures; Corrosion; Degradation; Electrostatic discharges; Humidity; Vertical cavity surface emitting lasers; Laser reliability; TEM; aging; corrosion; laser degradation; oxide VCSEL;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2013.2285572
  • Filename
    6631498