• DocumentCode
    496066
  • Title

    A reusable coverage-driven verification environment for Network-on-Chip communication in embedded system platforms

  • Author

    Vitullo, Francesco ; Saponara, Sergio ; Petri, Esa ; Casula, Michele ; Fanucci, Luca ; Maruccia, Giuseppe ; Locatelli, Riccardo ; Coppola, Marcello

  • Author_Institution
    Dept. of Inf. Eng., Univ. of Pisa, Pisa, Italy
  • fYear
    2009
  • fDate
    25-26 June 2009
  • Firstpage
    71
  • Lastpage
    77
  • Abstract
    Functional verification plays an important role in the design flow of an intellectual property (IP) core and, in general, of an embedded system. The industrial trend of the last two decades has been to produce more and more complex embedded systems by integrating several IP cores on a single chip die; while this is easily possible thanks to the availability of ready-to-use off-the-shelf components, the functional verification of the whole system becomes a major concern. Hand-written HDL test-benches or formal approaches to verification are no more feasible methods to assess good quality verification in a reasonable amount of time. To meet the new requirements of complex systems design, EDA companies are developing verification tools that bring rapid development, reusability concepts and automation techniques also in the world of functional verification. This work faces the issue of providing an automated verification environment for a network-on-chip component that is part of a complex communication infrastructure within a multi-core embedded system. In this context, reusability is a key feature of the environment, because it allows the user to easily move from component verification to network verification. The verification tool used in this work is Spec-man elite by Cadence and the IP it is applied to is a spidergon-STNoC (by STMicroelectronics) component. Verification environment design guidelines are provided together with a final coverage report summary.
  • Keywords
    embedded systems; industrial property; logic design; network-on-chip; automation techniques; e-reuse methodology; functional verification; hand-written HDL test-bench; intellectual property; multicore embedded system; multiprocessor system-on-chip; network-on-chip communication; single chip die; Automatic testing; CMOS technology; Design engineering; Electronic design automation and methodology; Embedded system; Formal verification; Hardware design languages; Intellectual property; Network-on-a-chip; System testing; Functional Coverage; Functional Verification; Intellectual Property (IP); Multi-Processor System-on-Chip (MPSoC); Network-on-Chip (NoC); e Reuse Methodology (eRM);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent solutions in Embedded Systems, 2009 Seventh Workshop on
  • Conference_Location
    Ancona
  • Print_ISBN
    978-1-4244-4838-8
  • Electronic_ISBN
    978-88-87548-02-0
  • Type

    conf

  • Filename
    5186399