Title :
Analysis and Mitigation of Effect of Plating Stub on Transmission Waveform and Eye Diagram
Author :
Guang-Hwa Shiue ; Chi-Lou Yeh ; Zhi-Hao Zhang ; Hung-Hsiang Cheng
Author_Institution :
Electron. Eng. Dept., Chung Yuan Christian Univ., Jhongli, Taiwan
Abstract :
Plating stubs inevitably form in the manufactured processes for ball grid array packages. This paper investigates how the plating stub affects the time-domain transmission (TDT) waveform and eye diagram. A scheme for mitigating the effect of the plating stub is also proposed. The effects of time-domain reflection noise generated by the plating stub on the TDT waveform are precisely studied using a lattice diagram. Simple and approximate formulas are developed to determine whether the eye diagram crosses the eye mask. With this determination, the maximum length of the plating stub can be estimated.
Keywords :
ball grid arrays; electroplating; manufacturing processes; time-domain analysis; TDT waveform; ball grid array packages; eye diagram; eye mask; lattice diagram; manufactured process; mitigation effect; plating stub; time-domain reflection noise; time-domain transmission waveform; Delay effects; Lattices; Metals; Microstrip; Noise; Resonant frequency; Time-domain analysis; Eye diagram; lattice diagram; plating stub; time-domain transmission (TDT) waveform;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2013.2284029
