Title :
The Scattering Study of Rough Surface by Ray Tracing Technique
Author :
Wen, Xiaoyang ; Wang, Chao ; Zhang, Hong
Author_Institution :
Cold & Arid Regions Environ. & Eng. Res. Inst., Chinese Acad. of Sci., Lanzhou, China
Abstract :
The model of soil surface scattering is implemented in the paper. The ray tracing (RT) model is introduced to solve the soil scattering problem. The soil surface is characterized by the rms of its height distribution relating to wavelength and by the space correlation length of an extracted profile from this surface. The RT result is compared with Kirchhoff approximation (KA) result, and the result matches well.
Keywords :
ray tracing; surface roughness; Kirchhoff approximation; height distribution; ray tracing technique; rough surface; scattering study; soil surface scattering; space correlation length; Electromagnetic scattering; Geoscience; Kirchhoff´s Law; Optical scattering; Optical surface waves; Ray tracing; Rough surfaces; Soil; Surface roughness; Surface waves; SAR; high frequency; ray tracing; rough surface; scattering;
Conference_Titel :
Environmental Science and Information Application Technology, 2009. ESIAT 2009. International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-0-7695-3682-8
DOI :
10.1109/ESIAT.2009.552
